RESISTIVITY OF SEMICONDUCTORS BY FOUR PROBE METHOD AT DIFFERENT TEMPERATURES & DETERMINATION OF BANDGAP – GUPTA BRAND 200220

Features :The experiment consists of the following accessories for four probe arrangement, oven (upto 200oC), Germanium crystal mounted, Thermometer (0-200oC), four probe setup, constant current power supply, digital electronic millivoltmeter of range 200 mV. Display 31/2 digit 7 segment LED

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